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Method for 3D Nonlinear Structured Illumination Super-resolution Imaging
Researchers at the University of Arizona have developed a super-resolution microscopy method that is faster, easier to use, and has less artifacts than current super-resolution methods. The result is a 3D dual-color stimulated emission depletion (STED) nonlinear structured illumination (NL-SIM) microscope. Using a combination of low coherent light and...
Published: 4/3/2023
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Inventor(s): Leilei Peng, Yu Li, Han Zhang
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Medical Imaging, Technology Classifications > Imaging & Optics > Microscopy, Spectroscopy, Polarimetry
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Energy Efficient Switching In Magnetic Tunnel Junctions With An Antiferromagnetic Barrier
This invention is a magnetic tunneling junction (MTJ) design to realize more efficient switching. This design includes the use of an antiferromagnetic layer.
Background:
Spintronics represents a promising solution to address the problem of greatly increased power consumption in CMOS transistors for memory and logic applications. Storing information...
Published: 3/12/2024
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Inventor(s): Shufeng Zhang, Weigang Wang, Yihong Cheng, Meng Xu, Pravin Khanal
Keywords(s):
Category(s): Technology Classifications > Engineering & Physical Sciences > Electronics > Data Storage, Technology Classifications > Engineering & Physical Sciences > Electronics > Computer Hardware, Technology Classifications > Engineering & Physical Sciences > Electronics > Digital Circuits
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Chromium Oxide for Enhanced Magnetic Tunnel Junctions
This invention is a novel magnetic tunnel junction (MTJ) design, which utilizes an antiferromagnetic material in a new configuration to reduce high switching energies in spintronics.
Background:
Spintronics represents a promising solution to ever increasing power consumption and heat generation in semiconductor transistors by utilizing both electron...
Published: 9/27/2024
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Inventor(s): Weigang Wang, Ty Newhouse-Illige, Ali Habiboglu, Yihong Cheng, Shufeng Zhang, Meng Xu, Pravin Khanal
Keywords(s):
Category(s): Technology Classifications > Materials, Technology Classifications > Engineering & Physical Sciences > Devices & Instrumentation, Technology Classifications > Engineering & Physical Sciences > Electronics
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