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Ultra-Narrowband Induced Transmission Filter for EUV Lithography
This invention introduces a transmission-based induced filter operating in the extreme ultraviolet (EUV) regime. The purpose of the invention is to create high transmittance and ultranarrow band filters for EUV lithography even with losses. The filter is composed of EUV-compatible mirrors and a lossy medium. At the resonance frequency, there is minimal...
Published: 6/30/2025
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Inventor(s): Mohamed ElKabbash
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Microscopy, Spectroscopy, Polarimetry, Technology Classifications > Imaging & Optics > Medical Imaging, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
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Application of Polarization Imaging in Identification and Metrology of Gemstone
This invention presents a method and instrumentation for gemstone identification and metrology using polarization imaging. It is a simple and cost-effective metrology system that distinguishes gemstones of various materials and cuts. The invention uses a combination of filters, a polarization camera, and other elements to form an image of the gemstone,...
Published: 6/26/2025
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Inventor(s): Stanley Pau, Alaa Hamdoh, Linan Jiang, Yufei Gao
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Imaging & Optics > Microscopy, Spectroscopy, Polarimetry, Technology Classifications > Imaging & Optics > Optical Fab / Metrology
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Fifth Harmonic and Five-Photon Excitation Fluorescence Multiphoton Microscopy
This technology introduces a fifth-order multiphoton microscopy system. This advanced method enables high-resolution, label-free imaging of biological samples using nonlinear optical effects. Laser scanning multiphoton microscopy has gained prevalence across a wide range of applications due to its high-resolution imaging potential. This system uses...
Published: 6/23/2025
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Inventor(s): Khanh Kieu
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Imaging & Optics > Microscopy, Spectroscopy, Polarimetry, Technology Classifications > Engineering & Physical Sciences > Semiconductors, Technology Classifications > Research Tools
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Method and System for 360 Degree 3D Measurement of Complex Objects and Human Bodies
This invention presents a method for performing full-field 360-degree 3D measurements of complex objects and human bodies using advanced projection technology originally developed for virtual reality applications. Captured light reflected from the object’s surface as well as the surface shape are reconstructed using advanced 3D imaging technologies...
Published: 3/24/2025
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Inventor(s): Florian Willomitzer
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Medical Imaging, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
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Displacement and Acceleration Optomechanical Sensor
This technology is an optomechanical sensor primarily designed for displacement and acceleration sensing. This sensor uses a novel AC measurement technique to reduce interference from low-frequency noise such as 1/f electronics noise. This technique involves modulating the length of a micro-optical cavity, which can be done with a relatively simple...
Published: 5/6/2025
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Inventor(s): Felipe Guzman, Jose Sanjuan
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Lens & System Design, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
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Method and Device for Imaging and Ranging through Optical Fibers
This invention is a novel method and device for imaging and ranging through various types of optical fibers, including multi-mode and multi-core fibers. This technique allows for depth measurements and imaging without needing prior knowledge of the scene or the fiber's transmission matrix. By generating a “synthetic wavefront” through...
Published: 11/7/2024
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Inventor(s): Florian Willomitzer, Stefan Forschner, Patrick Cornwall, Manuel Ballester, Muralidhar Madabhushi Balaji, Jürgen Czarske
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Fiber Optics, Technology Classifications > Imaging & Optics > Medical Imaging, Technology Classifications > Imaging & Optics > Optical Fab / Metrology, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
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Computer Vision Method for Safety Hazards Detection, Referencing, and Tracking
This invention is a method for automatic identification and real-time mapping of safety hazards and individuals within underground spaces, such as mines. Using a combination of visual, Near-Infrared (NIR), and LiDAR imaging technologies with a robust, low-cost, machine learning-based algorithm, this innovation captures data and geo-references and categorizes...
Published: 1/28/2025
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Inventor(s): Maria Nathalie Risso, Angelina Anani, Pedro Lopez-Vidaurre
Keywords(s):
Category(s): Technology Classifications > Engineering & Physical Sciences > Industrial & Manufacturing > Mining, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Software & Information Technology
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Lensfree Microscopy for Ultrafine Particulate Matter Monitoring
This system monitors ultrafine particulate matter and pollution in the air using compact, inexpensive, and portable devices, which enable time-resolved measurements particle sizes. It could be used to implement a dense network of devices, which provide ultra-precise real-time monitoring of air content and quality levels.
Background:
Particulate matter...
Published: 10/11/2023
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Inventor(s): Euan Mcleod, Maryam Baker
Keywords(s):
Category(s): Technology Classifications > Energy, Cleantech & Environmental, Technology Classifications > Energy, Cleantech & Environmental > Air/Water Purification, Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Sensors and Detection, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
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Wide Area Spectralelectrochemical Measurement of Thin Film Semiconductors for Electronic Band Structure Analysis
This invention is a rapid, nondestructive detection method for properties of semiconductor stacks (including perovskite stacks for use in photovoltaics) which can be used at speeds and scales relevant for manufacturing to check product quality. This invention could reduce/remove barriers for manufacturing scale-up and production of high quality robust...
Published: 12/16/2024
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Inventor(s): Erin Ratcliff, Michel De Keersmaecker, Neal Armstrong
Keywords(s):
Category(s): Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy, Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy > Solar/Photovoltaic, Technology Classifications > Engineering & Physical Sciences > Semiconductors, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Materials > Processing, Technology Classifications > Sensors & Controls
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Random Multi-Spectral and Polarization Structured Light Illumination for 3D Imaging
This invention is a method to improve accuracy and acquisition time of three-dimensional (3D) imaging systems by using illumination patterns with different spectrum and polarization states and simultaneously measuring the reflected patterns that can distinguish light of different spectrum and polarization states. Unlike existing techniques that utilize...
Published: 5/19/2025
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Inventor(s): Stanley Pau, Rongguang Liang
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Medical Imaging, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Life Sciences > Diagnostics
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