Invention:
This invention describes a method of using multiphoton microscopy (MPM) for 3-dimensional imaging and spectral analysis of natural and synthetic diamonds, as well as diamond-like simulants. This non-destructive approach provides insights into the interior structure, fluorescent defects, and formation conditions of diamonds. This method can be used to investigate gemstone quality and may trace gemstone provenance and treatment history.
Background:
Diamonds offer unique benefits for optical technology development due to their optical, chemical, electrical, mechanical, and thermal properties. These attributes also contribute to their aesthetic appeal, high commercial value, and utility in geological studies. Traditional diamond inspection methods often lack the ability to provide enough information without risking damage to the diamond sample. These methods, which include optical microscopy and X-ray imaging, are limited by low resolution, an inability to capture three-dimensional features accurately, and challenges in visualizing inclusions within materials. Gemologists and researchers are looking for more advanced techniques that can produce high-resolution, non-destructive imaging of the internal features of diamonds. This new approach addresses these limitations by offering better depth penetration, enhanced clarity, and precise structural mapping without compromising the integrity of the diamond.
Applications:
- Diamond quality assessment
- Gemstone quality assessment
- Vacancy centers in quantum technologies
- Multiphoton microscopy (MPM)
Advantages:
- 3-dimensional imaging of diamonds
- Non-destructive method
- Precise structural mapping
- Keeps diamond integrity intact
- Unique insights about the diamond, including provenance and treatment history
