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An Efficient Method to Estimate Parameters of the Cavity on Integrated Photonic Chips
This technology is a method for estimating parameters of the cavity on integrated photonic chips. This innovative approach simplifies the estimation process, offering a practical and reliable solution for manufacturers in the industry to help streamline testing procedures. With its simplicity and efficiency, this technology saves valuable time and resources,...
Published: 7/8/2025
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Inventor(s): Chaohan Cui, Linran Fan
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Materials & Fabrication
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