Invention:
This technology is a method for estimating parameters of the cavity on integrated photonic chips. This innovative approach simplifies the estimation process, offering a practical and reliable solution for manufacturers in the industry to help streamline testing procedures. With its simplicity and efficiency, this technology saves valuable time and resources, providing accurate estimations of cavity characteristics without the need for complex fitting processes. The key advantage of this method lies in its ability to distinguish different coupling regimes, resulting in precise calibration of coupling constants. This feature enables the realization of integrated photonic platforms with micro-resonators, unlocking their potential in various applications such as optical filters, sensors, and computing units.
Background:
The performance and efficiency of future optical devices rely heavily on integrated photonic chips, within which photonic cavities play a critical role. However, a pressing issue in the industry is the ability to precisely determine these cavities' properties, a process pivotal for optimal device operation. Traditional methods for calibrating photonic cavities have proven to be unreliable and not conducive to large-scale production. These methods often involve laborious and complex techniques that are unable to definitively separate the different coupling regimes. Furthermore, they struggle with the challenge of directly detecting the intra-cavity field in integrated photonic micro-resonators, leading to increased complexity and undesirable system losses.
Applications:
- Quantum computing
- Optical filters
- Photonic research
- Sensors
Advantages:
- Improved accuracy and efficiency
- Simple and robust
- Enables mass production
- Streamlines testing
