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Wide Area Spectralelectrochemical Measurement of Thin Film Semiconductors for Electronic Band Structure Analysis

This invention is a rapid, nondestructive detection method for properties of semiconductor stacks (including perovskite stacks for use in photovoltaics) which can be used at speeds and scales relevant for manufacturing to check product quality. This invention could reduce/remove barriers for manufacturing scale-up and production of high quality robust...

Published: 6/20/2024 | Inventor(s): Erin Ratcliff, Michel De Keersmaecker, Neal Armstrong

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Category(s): Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy, Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy > Solar/Photovoltaic, Technology Classifications > Engineering & Physical Sciences > Semiconductors, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Materials > Processing, Technology Classifications > Sensors & Controls

In-line Analytical Measurements for High-Throughput Manufacturing of Solar Cells, Enhancing Scalability of Next Generation Semiconductor Thin Film Stacks

A “stick and peel” removable electrochemical probe is used for solvent-free characterization of semiconductor films or optoelectronic devices and configured for use in situ and/or in operando. The invention may be used to analyze electronic materials such as a metal halide perovskite, an organic semiconductor, a nanocrystalline (quantum...

Published: 3/12/2024 | Inventor(s): Michel De Keersmaecker, Erin Ratcliff, Neal Armstrong

Keywords(s):

Defect Characterization for Semiconductors, including Perovskites, in Operando or during Manufacturing, using 'Peel and Stick' Probe with Enhanced Sensitivity

This technology involves the use of a removable ‘peel and stick electrolyte’ probe for detecting defects in perovskite materials. This is an improvement on previous technology that increases sensitivity of defect detection in device-relevant triple cation perovskites. Background: The development of next-generation flexible optoelectronic...

Published: 3/12/2024 | Inventor(s): Michel De Keersmaecker, Erin Ratcliff, Neal Armstrong

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"Stick and Peel" Probe Properties of Perovskite Material Properties for Manufacturing Scale-Up and Quality Control

A “stick and peel” removable electrochemical probe is used for solvent-free characterization of semiconductor films or optoelectronic devices. The invention may be used to analyze electronic materials such as a metal halide perovskite, an organic semiconductor, a nanocrystalline (quantum dot) thin film, metal oxides, a material blend or...

Published: 3/12/2024 | Inventor(s): Michel De Keersmaecker, Erin Ratcliff, Neal Armstrong

Keywords(s):