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Computer Vision Method for Safety Hazards Detection, Referencing, and Tracking
This invention is a method for automatic identification and real-time mapping of safety hazards and individuals within underground spaces, such as mines. Using a combination of visual, Near-Infrared (NIR), and LiDAR imaging technologies with a robust, low-cost, machine learning-based algorithm, this innovation captures data and geo-references and categorizes...
Published: 4/23/2024
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Inventor(s): Maria Nathalie Risso, Angelina Anani, Pedro Lopez-Vidaurre
Keywords(s):
Category(s): Technology Classifications > Engineering & Physical Sciences > Industrial & Manufacturing > Mining, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Software & Information Technology
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RINO App
Non-Contact and Real-time Dynamic Displacement Monitoring Using Smartphone Technologies (RINO App) is a new smartphone application, developed for iOS, for the application of dynamic displacement measurements as one of the available approaches for Structural Health Monitoring (SHM).
Background:
Structural Health Monitoring (SHM) aims to give, at...
Published: 3/28/2024
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Inventor(s): Nikolas Gelo, Hongki Jo, Jaehong Min
Keywords(s):
Category(s): Technology Classifications > Software & Information Technology > Mobile Application, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Imaging & Optics > Sensors and Detection > Remote Sensing, Technology Classifications > Imaging & Optics > Materials & Fabrication > Optical, EO & MO, Technology Classifications > Software & Information Technology > Computer-Aided Design & Engineering
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Lensfree Microscopy for Ultrafine Particulate Matter Monitoring
This system monitors ultrafine particulate matter and pollution in the air using compact, inexpensive, and portable devices, which enable time-resolved measurements particle sizes. It could be used to implement a dense network of devices, which provide ultra-precise real-time monitoring of air content and quality levels.
Background:
Particulate matter...
Published: 10/11/2023
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Inventor(s): Euan Mcleod, Maryam Baker
Keywords(s):
Category(s): Technology Classifications > Energy, Cleantech & Environmental, Technology Classifications > Energy, Cleantech & Environmental > Air/Water Purification, Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Sensors and Detection, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
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Wide Area Spectralelectrochemical Measurement of Thin Film Semiconductors for Electronic Band Structure Analysis
This invention is a rapid, nondestructive detection method for properties of semiconductor stacks (including perovskite stacks for use in photovoltaics) which can be used at speeds and scales relevant for manufacturing to check product quality. This invention could reduce/remove barriers for manufacturing scale-up and production of high quality robust...
Published: 3/12/2024
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Inventor(s): Erin Ratcliff, Michel De Keersmaecker, Neal Armstrong
Keywords(s):
Category(s): Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy, Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy > Solar/Photovoltaic, Technology Classifications > Engineering & Physical Sciences > Semiconductors, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Materials > Processing, Technology Classifications > Sensors & Controls
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Random Multi-Spectral and Polarization Structured Light Illumination for 3D Imaging
This invention is a method to improve accuracy and acquisition time of three-dimensional (3D) imaging system by using illumination patterns with different spectrum and polarization states and simultaneously measuring the reflected patterns that can distinguishes light of different spectrum and polarization states. Unlike existing technique which utilizes...
Published: 1/10/2024
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Inventor(s): Stanley Pau, Rongguang Liang
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Medical Imaging, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Life Sciences > Diagnostics
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"Stick and Peel" Probe Properties of Perovskite Material Properties for Manufacturing Scale-Up and Quality Control
A “stick and peel” removable electrochemical probe is used for solvent-free characterization of semiconductor films or optoelectronic devices. The invention may be used to analyze electronic materials such as a metal halide perovskite, an organic semiconductor, a nanocrystalline (quantum dot) thin film, metal oxides, a material blend or...
Published: 3/12/2024
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Inventor(s): Michel De Keersmaecker, Erin Ratcliff, Neal Armstrong
Keywords(s):
Category(s): Technology Classifications > Energy, Cleantech & Environmental > Energy Collection, Storage & Battery, Technology Classifications > Energy, Cleantech & Environmental > Fuel Cells, Technology Classifications > Energy, Cleantech & Environmental > Manufacturing, Technology Classifications > Energy, Cleantech & Environmental > Low Carbon, Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy > Solar/Photovoltaic, Technology Classifications > Engineering & Physical Sciences > MEMS & Nanotechnology, Technology Classifications > Engineering & Physical Sciences > Semiconductors, Technology Classifications > Imaging & Optics > Materials & Fabrication, Technology Classifications > Imaging & Optics > Sensors and Detection, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Materials > Chemicals, Technology Classifications > Materials > Nanomaterials, Technology Classifications > Materials > Processing, Technology Classifications > Sensors & Controls
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Wave Front Sensor based on Fourier Filtering
This invention describes a sensor that can measure the wave front of an incoming electromagnetic wave. The sensor has application in semiconductor and precision optics metrology, ophthalmic diagnostic imaging, remote sensing and laser beam characterization. In addition, wave front sensor is a key component of adaptive optics system which is used in...
Published: 8/8/2023
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Inventor(s): Stanley Pau, David Brady
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Sensors and Detection > Remote Sensing, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
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Real-Time Snake Detector Utilizing TensorFlow Lite API Mobile Application
This invention is a mobile application which could be used to detect and warn in real time, the presence of snakes utilizing machine learning software.
Background:
With increasing commercial and residential growth in places like Florida and Australia that have a great population of snakes, this construction is causing the reptiles' natural habitat...
Published: 2/1/2024
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Inventor(s): Marco Tavera-Reyes, Carlos Field-Sierra
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Engineering & Physical Sciences > Communications & Networking > Wireless
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Compact Snapshot Dual-Mode Interferometric System
This technology is an interferometric system that measures both surface shape and roughness and is designed for on-machine metrology.
Background:
Interferometry uses constructive and destructive interference in waves to obtain information. One common application of this field is to examine the properties of a surface, often at nanoscale. When mounted...
Published: 4/3/2023
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Inventor(s): Rongguang Liang
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
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Air Transportation Luggage Security - Stochastic Bag Generator (SBG)
This technology is a method of modeling the response of a luggage inspection device based on a variety of contents and packing styles. The method is used to calibrate inspection instruments' responses, and predict successful inspection. This allows for better inspection machine design, decreases the number of bags pulled for secondary screening,...
Published: 4/3/2023
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Inventor(s): Amit Ashok, James Huang
Keywords(s):
Category(s): Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
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