Heliostat Deflectometry

Case ID:
UA24-207
Invention:

This invention is a novel heliostat metrology method to analyze and assess heliostat quality. This method is designed for use with large format meter-scale heliostat mirrors. Through the use of a unique modulation-free pattern approach, this metrology method can be used in outdoor environments. In the context of heliostats, deflectometry is employed to ensure that the mirrors are accurately aligned and properly shaped to reflect sunlight onto a central receiver in concentrated solar power (CSP) systems. The novel deflectometry method provides a relatively inexpensive solution to solar energy and can be used in large-scale applications. 

Background: 
Heliostat mirrors play a crucial role in CSP systems by reflecting sunlight towards a central receiver. Accurate alignment and surface quality of these mirrors are essential for optimal system performance. Traditional metrology methods often struggle with environmental factors and the need for complex modulation techniques. To maximize heliostat efficiency and implement quality control, it is important to be able to accurately assess the surface of a heliostat mirror for bumps and irregularities. Deflectometry is a metrology method for reflective surfaces like heliostat mirrors. Current methods of heliostat metrology and deflectometry are expensive, can only be used indoors, and lack scalability. This technology is an improved method which is suitable for outdoor applications and scalable. 

Applications: 

  • Heliostat metrology
  • Concentrated solar power systems
  • Research and development


Advantages: 

  • Outdoor-capable
  • Scalable
  • Modulation-free
  • Cost-effective
Patent Information:
Contact For More Information:
Richard Weite
Senior Licensing Manager, College of Optical Sciences
The University of Arizona
RichardW@tla.arizona.edu
Lead Inventor(s):
Daewook Kim
James Angel
Yiyang Huang
Keywords: