Search Results - jiazhang+wang

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Method and System for 3D Imaging using Deflectometric Information and Polarization
This invention describes a novel method of 3D reconstruction imaging, utilizing a blend of deflectometry and shape from polarization (SfP). In order to overcome the limitations of current methods of 3D imaging, the technology will pursue exploitation of deflectometric and SfP information to achieve an overall faster 3D reconstruction with polarization...
Published: 4/24/2024   |   Inventor(s): Florian Willomitzer, Jiazhang Wang
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics > Displays, Technology Classifications > Imaging & Optics > Medical Imaging
Method and System for Eye Tracking using Structured Light
This invention represents a significant advancement in the field of eye tracking technology by introducing a novel deflectometry approach to enhance accuracy that relies on leveraging dense 3D information obtained from the eye surface to estimate gaze direction. The key objective is to substantially decrease gaze estimation errors, aiming to improve...
Published: 4/24/2024   |   Inventor(s): Florian Willomitzer, Jiazhang Wang
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics > Displays, Technology Classifications > Imaging & Optics > Lens & System Design
Method for 3D Nonlinear Structured Illumination Super-resolution Imaging
Researchers at the University of Arizona have developed a super-resolution microscopy method that is faster, easier to use, and has less artifacts than current super-resolution methods. The result is a 3D dual-color stimulated emission depletion (STED) nonlinear structured illumination (NL-SIM) microscope. Using a combination of low coherent light and...
Published: 4/3/2023   |   Inventor(s): Leilei Peng, Yu Li, Han Zhang
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Medical Imaging, Technology Classifications > Imaging & Optics > Microscopy, Spectroscopy, Polarimetry