Optical Gating Of Electron Pulses For Femtosecond And Attosecond Electron Microscopy And Diffraction Imaging Applications

Case ID:
UA18-144
Invention:

This technology provides a novel twist on the conventional optical gating technique and results in electron pulses of less that 100 femtoseconds. This provides improved temporal resolution for imaging done by electron microscopy and diffraction imaging.

 

Background: Traditional electron microscopes are limited in their temporal resolution. The current state of the art has only achieved 200 femtosecond electron pulse widths.  Using faster optical pulses to gate the electron pulses has been limited by the limitations on the optical pulse widths to drive the gating.

 

Applications:

  • Electronics manufacturing
  • Materials science
  • Forensic science
  • Molecular mechanisms of disease (efficacy of treatment, predisposition to disease, etc.)
  • Observing individual viruses and macromolecular complexes

 

Advantages:

  • Improves temporal resolution
  • Explores the ultrafast dynamics of matter
  • Addresses a very specific industry demand
Patent Information:
Contact For More Information:
Jonathan Larson
Senior Licensing Manager, College of Science
The University of Arizona
jonathanlarson@arizona.edu
Lead Inventor(s):
Mohammed Tharwat Hassan
Keywords: